Kim Joohee received a Master’s Degree in Electrical Engineering and Computer Science at the Korea Advanced Institute of Science & Technology [KAIST], Daejeon, Korea, in 2009, where she is currently pursuing a Master's Degree in Electrical Engineering and Computer Science. She has been working on the signal integrity design of high-speed digital system over gigahertz. Her current research interest is to analyze the electrical characteristics of Through Signal Vias (TSVs) in 3-D Integrated Circuits (ICs) and to suggest an analytic model of TSVs in order to estimate signal integrity with the equivalent circuit in high-speed digital system. Her research includes jitter/eye diagram estimation of TSVs in 3-D IC. joohee@eeinfo.kaist.ac.krSunday 12 October 2008
Kim Joohee
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Kim Joohee received a Master’s Degree in Electrical Engineering and Computer Science at the Korea Advanced Institute of Science & Technology [KAIST], Daejeon, Korea, in 2009, where she is currently pursuing a Master's Degree in Electrical Engineering and Computer Science. She has been working on the signal integrity design of high-speed digital system over gigahertz. Her current research interest is to analyze the electrical characteristics of Through Signal Vias (TSVs) in 3-D Integrated Circuits (ICs) and to suggest an analytic model of TSVs in order to estimate signal integrity with the equivalent circuit in high-speed digital system. Her research includes jitter/eye diagram estimation of TSVs in 3-D IC. joohee@eeinfo.kaist.ac.kr
Kim Joohee received a Master’s Degree in Electrical Engineering and Computer Science at the Korea Advanced Institute of Science & Technology [KAIST], Daejeon, Korea, in 2009, where she is currently pursuing a Master's Degree in Electrical Engineering and Computer Science. She has been working on the signal integrity design of high-speed digital system over gigahertz. Her current research interest is to analyze the electrical characteristics of Through Signal Vias (TSVs) in 3-D Integrated Circuits (ICs) and to suggest an analytic model of TSVs in order to estimate signal integrity with the equivalent circuit in high-speed digital system. Her research includes jitter/eye diagram estimation of TSVs in 3-D IC. joohee@eeinfo.kaist.ac.kr
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